• DocumentCode
    2357005
  • Title

    Thermal modeling and analysis of pin grid arrays and multichip modules

  • Author

    Sullhan, Raj ; Fredholm, Mike ; Monaghan, Tom ; Agarwal, Anil ; Kozarek, Bob

  • Author_Institution
    Alcoa Electronic Packaging Inc., San Diego, CA, USA
  • fYear
    1991
  • fDate
    12-14 Feb 1991
  • Firstpage
    110
  • Lastpage
    116
  • Abstract
    The thermal analysis of a ceramic pin grid array and multichip module was performed. A finite element computer program was used to build the thermal model. The effects that the air flow, the thermal conductivity of the substrate material, the substrate thickness, the thermal conductivity of the die attach material, and the die attach thickness have on internal and external resistances of pin grid arrays are addressed, covering the factors that control the internal and external resistances of the package. In the case of multichip modules the effects of these parameters on the maximum junction temperature rise and maximum case temperature rise have been studied. Experimental results for a ceramic pin grid array are presented. A set of charts can be used for quickly designing the package, and for choosing assembly materials and the environment for the most optimum thermal management
  • Keywords
    electronic engineering computing; finite element analysis; integrated circuit technology; modules; packaging; temperature distribution; thermal analysis; thermal resistance; air flow; assembly materials; ceramic PGA; die attach material; finite element computer program; maximum case temperature rise; maximum junction temperature rise; multichip modules; optimum thermal management; package; pin grid arrays; substrate thermal conductivity; substrate thickness; thermal analysis; thermal model; thermal resistance; Ceramics; Conducting materials; Electronics packaging; Microassembly; Multichip modules; Temperature; Thermal conductivity; Thermal factors; Thermal management; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 1991. SEMI-THERM VII. Proceedings., Seventh Annual IEEE
  • Conference_Location
    Phoenix, AZ
  • Print_ISBN
    0-87942-664-0
  • Type

    conf

  • DOI
    10.1109/STHERM.1991.152923
  • Filename
    152923