Title :
Effect of contact resistivities and interface properties on the performance of SiC power devices
Author :
Wang, T.K. ; Chow, T.P. ; Brown, D.M. ; Ghezzo, M.
Author_Institution :
Rensselaer Polytechnic Institute
Keywords :
Contact resistance; FETs; Implants; Ohmic contacts; Photonic band gap; Schottky barriers; Semiconductor materials; Silicon carbide; Substrates; Thermal conductivity;
Conference_Titel :
Power Semiconductor Devices and ICs, 1992. ISPSD '92. Proceedings of the 4th International Symposium on
DOI :
10.1109/ISPSD.1992.991292
