DocumentCode
2357136
Title
Power MOSFET analysis/optimization for cryogenic operation including the effect of degradation in breakdown voltage
Author
Singh, Ranbir ; Baliga, B. Jayant
Author_Institution
North Carolina State University
fYear
1992
fDate
1992
Firstpage
339
Lastpage
344
Keywords
Cryogenics; Degradation; High temperature superconductors; MOSFET circuits; Power MOSFET; Silicon; Switched-mode power supply; Temperature dependence; Thermal conductivity; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices and ICs, 1992. ISPSD '92. Proceedings of the 4th International Symposium on
Type
conf
DOI
10.1109/ISPSD.1992.991298
Filename
991298
Link To Document