• DocumentCode
    2357195
  • Title

    Effects of moisture on reliability of gold and copper ball bonds

  • Author

    Breach, C.D. ; Shen, Ng Hun ; Mun, Tee Wai ; Lee, Teck Kheng ; Holliday, R.

  • Author_Institution
    ProMat Consultants, Singapore, Singapore
  • fYear
    2010
  • fDate
    8-10 Dec. 2010
  • Firstpage
    44
  • Lastpage
    51
  • Abstract
    Gold and copper ball bonds were isothermally aged under moist conditions (85°C and 85% relative humidity (RH)) and wet conditions (85°C in DI water with and without NaCl) in an effort to better understand the corrosion mechanisms that operate under moist and wet conditions. The objective of this work is to undertake and report on the initial stages of a research project that aims to compare the performance and assess the performance limits of gold and copper ball bonds.
  • Keywords
    bonding processes; copper; electronics packaging; gold; integrated circuit interconnections; moisture; semiconductor device reliability; copper ball bonds; gold ball bonds; moisture effect; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2010 12th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-8560-4
  • Electronic_ISBN
    978-1-4244-8561-1
  • Type

    conf

  • DOI
    10.1109/EPTC.2010.5702603
  • Filename
    5702603