DocumentCode
2357195
Title
Effects of moisture on reliability of gold and copper ball bonds
Author
Breach, C.D. ; Shen, Ng Hun ; Mun, Tee Wai ; Lee, Teck Kheng ; Holliday, R.
Author_Institution
ProMat Consultants, Singapore, Singapore
fYear
2010
fDate
8-10 Dec. 2010
Firstpage
44
Lastpage
51
Abstract
Gold and copper ball bonds were isothermally aged under moist conditions (85°C and 85% relative humidity (RH)) and wet conditions (85°C in DI water with and without NaCl) in an effort to better understand the corrosion mechanisms that operate under moist and wet conditions. The objective of this work is to undertake and report on the initial stages of a research project that aims to compare the performance and assess the performance limits of gold and copper ball bonds.
Keywords
bonding processes; copper; electronics packaging; gold; integrated circuit interconnections; moisture; semiconductor device reliability; copper ball bonds; gold ball bonds; moisture effect; reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference (EPTC), 2010 12th
Conference_Location
Singapore
Print_ISBN
978-1-4244-8560-4
Electronic_ISBN
978-1-4244-8561-1
Type
conf
DOI
10.1109/EPTC.2010.5702603
Filename
5702603
Link To Document