DocumentCode
2357243
Title
Exploiting instruction redundancy for transient fault tolerance [microprocessor applications]
Author
Sato, Toshinori
Author_Institution
Dept. of Artificial Intelligence, Kyushu Inst. of Technol., Iizuka, Japan
fYear
2003
fDate
3-5 Nov. 2003
Firstpage
547
Lastpage
554
Abstract
This paper presents an approach for integrating fault-tolerance techniques into microprocessors by utilizing instruction redundancy as well as time redundancy. Smaller and smaller transistors, higher and higher clock frequency, and lower and lower power supply voltage reduce the reliability of microprocessors. In addition, microprocessors are used in systems which require high dependability, such as e-commerce businesses. Based on these trends, it is expected that the quality with respect to reliability will become important as well as performance and cost for future microprocessors. To meet the demand, we have proposed and evaluated a fault-tolerance mechanism, which is based on instruction reissue and utilizes time redundancy, and found severe performance loss. In order to mitigate the loss, this paper proposes to exploit instruction redundancy. Using the reuse table, previously executed computing is reused for checking the occurrence of transient faults. From detailed simulations, we find that the performance loss caused by introducing fault tolerance into 4-way and 8-way superscalar processors is 12.5% and 20.8%, respectively.
Keywords
fault tolerance; integrated circuit reliability; logic design; logic simulation; microprocessor chips; redundancy; dependability; e-commerce; instruction redundancy; instruction reissue; microprocessor reliability; reuse table; superscalar processors; time redundancy; transient fault tolerance mechanism; Clocks; Costs; Fault tolerance; Frequency; Microprocessors; Performance loss; Power supplies; Power system reliability; Redundancy; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
ISSN
1550-5774
Print_ISBN
0-7695-2042-1
Type
conf
DOI
10.1109/DFTVS.2003.1250154
Filename
1250154
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