DocumentCode :
2357243
Title :
Exploiting instruction redundancy for transient fault tolerance [microprocessor applications]
Author :
Sato, Toshinori
Author_Institution :
Dept. of Artificial Intelligence, Kyushu Inst. of Technol., Iizuka, Japan
fYear :
2003
fDate :
3-5 Nov. 2003
Firstpage :
547
Lastpage :
554
Abstract :
This paper presents an approach for integrating fault-tolerance techniques into microprocessors by utilizing instruction redundancy as well as time redundancy. Smaller and smaller transistors, higher and higher clock frequency, and lower and lower power supply voltage reduce the reliability of microprocessors. In addition, microprocessors are used in systems which require high dependability, such as e-commerce businesses. Based on these trends, it is expected that the quality with respect to reliability will become important as well as performance and cost for future microprocessors. To meet the demand, we have proposed and evaluated a fault-tolerance mechanism, which is based on instruction reissue and utilizes time redundancy, and found severe performance loss. In order to mitigate the loss, this paper proposes to exploit instruction redundancy. Using the reuse table, previously executed computing is reused for checking the occurrence of transient faults. From detailed simulations, we find that the performance loss caused by introducing fault tolerance into 4-way and 8-way superscalar processors is 12.5% and 20.8%, respectively.
Keywords :
fault tolerance; integrated circuit reliability; logic design; logic simulation; microprocessor chips; redundancy; dependability; e-commerce; instruction redundancy; instruction reissue; microprocessor reliability; reuse table; superscalar processors; time redundancy; transient fault tolerance mechanism; Clocks; Costs; Fault tolerance; Frequency; Microprocessors; Performance loss; Power supplies; Power system reliability; Redundancy; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
ISSN :
1550-5774
Print_ISBN :
0-7695-2042-1
Type :
conf
DOI :
10.1109/DFTVS.2003.1250154
Filename :
1250154
Link To Document :
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