• DocumentCode
    2357243
  • Title

    Exploiting instruction redundancy for transient fault tolerance [microprocessor applications]

  • Author

    Sato, Toshinori

  • Author_Institution
    Dept. of Artificial Intelligence, Kyushu Inst. of Technol., Iizuka, Japan
  • fYear
    2003
  • fDate
    3-5 Nov. 2003
  • Firstpage
    547
  • Lastpage
    554
  • Abstract
    This paper presents an approach for integrating fault-tolerance techniques into microprocessors by utilizing instruction redundancy as well as time redundancy. Smaller and smaller transistors, higher and higher clock frequency, and lower and lower power supply voltage reduce the reliability of microprocessors. In addition, microprocessors are used in systems which require high dependability, such as e-commerce businesses. Based on these trends, it is expected that the quality with respect to reliability will become important as well as performance and cost for future microprocessors. To meet the demand, we have proposed and evaluated a fault-tolerance mechanism, which is based on instruction reissue and utilizes time redundancy, and found severe performance loss. In order to mitigate the loss, this paper proposes to exploit instruction redundancy. Using the reuse table, previously executed computing is reused for checking the occurrence of transient faults. From detailed simulations, we find that the performance loss caused by introducing fault tolerance into 4-way and 8-way superscalar processors is 12.5% and 20.8%, respectively.
  • Keywords
    fault tolerance; integrated circuit reliability; logic design; logic simulation; microprocessor chips; redundancy; dependability; e-commerce; instruction redundancy; instruction reissue; microprocessor reliability; reuse table; superscalar processors; time redundancy; transient fault tolerance mechanism; Clocks; Costs; Fault tolerance; Frequency; Microprocessors; Performance loss; Power supplies; Power system reliability; Redundancy; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2042-1
  • Type

    conf

  • DOI
    10.1109/DFTVS.2003.1250154
  • Filename
    1250154