• DocumentCode
    2357318
  • Title

    Development of a high voltage, high frequency, fast dV/dt tester for the study of failure mechanisms in dielectric materials

  • Author

    Tao, Fengfeng ; Yin, Weijun ; Schweickart, Daniel

  • Author_Institution
    GE Global Res. Center, Niskayuna, NY, USA
  • fYear
    2010
  • fDate
    23-27 May 2010
  • Firstpage
    505
  • Lastpage
    508
  • Abstract
    A bipolar, high voltage, high frequency pulse generator, with fast dv/dt rise time, was designed and assembled, based on stacked MOSFET modules. This unique design was implemented for the study of the impact of transient voltage with high repetition frequency on polymer insulation materials. Due to its all solid-state component design, the generator provides easily controllable output voltage magnitude (+/-10kV), frequency (<;=20kHz), and duty cycle ratio (10-90%). Practical considerations, such as circuit layout, high voltage/current protection, EMI, thermal management, etc., are discussed in the paper. Simulation and experimental results are included to verify the generator´s performance.
  • Keywords
    MOSFET; dielectric materials; failure analysis; insulating materials; modules; polymers; pulse generators; EMI; bipolar high voltage high frequency pulse generator; circuit layout; dielectric material; duty cycle ratio; failure mechanism; fast dv-dt rise time; high voltage-current protection; polymer insulation material; repetition frequency; solid-state component design; stacked MOSFET module; thermal management; transient voltage; voltage -10 kV; voltage 10 kV; voltage magnitude; Electromagnetic interference; Insulation; MOSFET circuits; Power supplies; Resistors; Switches; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Modulator and High Voltage Conference (IPMHVC), 2010 IEEE International
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    978-1-4244-7131-7
  • Type

    conf

  • DOI
    10.1109/IPMHVC.2010.5958405
  • Filename
    5958405