Title :
Determining partial thermal resistances with transient measurements, and using the method to detect die attach discontinuities
Author :
Rencz, M. ; Szekely, V. ; Morelli, A. ; Villa, C.
Author_Institution :
MicReD Ltd., Budapest, Hungary
Abstract :
The evaluation of the thermal transient measurements may result in the time constant density function and the structure function of the measured structure. In this paper we show how these results can be used to detect die attach or soldering problems of packages. Another application of the method in detecting partial thermal resistances in the heat flow path is also presented and evaluated.
Keywords :
microassembling; packaging; soldering; thermal resistance; transients; die attach discontinuities; heat flow path; package; partial thermal resistances; soldering problems; structure function; time constant density function; transient measurements; Density measurement; Electrical resistance measurement; Microassembly; Packaging; Resistance heating; Semiconductor device measurement; Steady-state; Testing; Thermal resistance; Time measurement;
Conference_Titel :
Semiconductor Thermal Measurement and Management, 2002. Eighteenth Annual IEEE Symposium
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-7327-8
DOI :
10.1109/STHERM.2002.991340