• DocumentCode
    2357556
  • Title

    Missing ball improvement for different lead free solders

  • Author

    Xiong, Bingshou ; Loo, Kum Weng ; Nagarajan, Kumar

  • Author_Institution
    Xilinx, Asia Pacific Pte. Ltd., Singapore, Singapore
  • fYear
    2010
  • fDate
    8-10 Dec. 2010
  • Firstpage
    147
  • Lastpage
    150
  • Abstract
    Government regulations for handling electronic waste materials are becoming more stringent. The European Union (EU) and China implemented regulations on the restriction of use of hazardous substances (RoHS) for electrical and electronic equipment on 1 July 2006 and 1 March 2007 respectively. One of the many intentions of these regulations is to ban the use of lead (Pb), which is commonly used for BGA solder ball. BGA solder ball composition need be changed from eutectic solder (Sn63Pb37) to SnAgCu or SnAg lead free solders, because of above environmental and regulation reasons. Since the introduction of Pb-Free initiatives, both academic and industry have extensively investigated solder ball composition and proposed to use SAC305/405 solder alloys because of its higher strength and reasonable melting point. However, on volume production, the industry realized these alloys are more fragile, and susceptible to high ppm level of IMC fracture under high-strain rate, e.g. handling, shipping, socketing etc.
  • Keywords
    RoHS compliance; ball grid arrays; copper alloys; government policies; hazardous materials; silver alloys; solders; tin alloys; BGA solder ball composition; China; European Union; IMC fracture; SnAgCu; electronic waste materials; eutectic solder; lead free solders; melting point; solder alloys;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2010 12th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-8560-4
  • Electronic_ISBN
    978-1-4244-8561-1
  • Type

    conf

  • DOI
    10.1109/EPTC.2010.5702623
  • Filename
    5702623