DocumentCode
2357556
Title
Missing ball improvement for different lead free solders
Author
Xiong, Bingshou ; Loo, Kum Weng ; Nagarajan, Kumar
Author_Institution
Xilinx, Asia Pacific Pte. Ltd., Singapore, Singapore
fYear
2010
fDate
8-10 Dec. 2010
Firstpage
147
Lastpage
150
Abstract
Government regulations for handling electronic waste materials are becoming more stringent. The European Union (EU) and China implemented regulations on the restriction of use of hazardous substances (RoHS) for electrical and electronic equipment on 1 July 2006 and 1 March 2007 respectively. One of the many intentions of these regulations is to ban the use of lead (Pb), which is commonly used for BGA solder ball. BGA solder ball composition need be changed from eutectic solder (Sn63Pb37) to SnAgCu or SnAg lead free solders, because of above environmental and regulation reasons. Since the introduction of Pb-Free initiatives, both academic and industry have extensively investigated solder ball composition and proposed to use SAC305/405 solder alloys because of its higher strength and reasonable melting point. However, on volume production, the industry realized these alloys are more fragile, and susceptible to high ppm level of IMC fracture under high-strain rate, e.g. handling, shipping, socketing etc.
Keywords
RoHS compliance; ball grid arrays; copper alloys; government policies; hazardous materials; silver alloys; solders; tin alloys; BGA solder ball composition; China; European Union; IMC fracture; SnAgCu; electronic waste materials; eutectic solder; lead free solders; melting point; solder alloys;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference (EPTC), 2010 12th
Conference_Location
Singapore
Print_ISBN
978-1-4244-8560-4
Electronic_ISBN
978-1-4244-8561-1
Type
conf
DOI
10.1109/EPTC.2010.5702623
Filename
5702623
Link To Document