Title :
Fault isolation by conquering obstruction effect of resistor in complex cases analysis
Author_Institution :
Freescale Semicond. (China) Ltd., Tianjin, China
fDate :
June 30 2014-July 4 2014
Abstract :
Resistor plays a key role in circuit designer´s view as it was indispensable for the whole circuit function. But for integrated circuit failure analysis, the effect of resistor contained both guidance and as well as blocks to find the root cause. The obstruction effect of resistor was seldom studied in failure analysis. This paper presented how resistor to be block for failure analysis. And how to conquer the obstruction effect was also studied which will be helpful in analyzing complicated failure cases.
Keywords :
failure analysis; fault diagnosis; integrated circuit reliability; resistors; complex cases analysis; fault isolation; integrated circuit failure analysis; obstruction effect; resistor; Failure analysis; Junctions; Metals; Resistance; Resistors; Temperature sensors; Transistors;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2014 IEEE 21st International Symposium on the
Conference_Location :
Marina Bay Sands
Print_ISBN :
978-1-4799-3931-2
DOI :
10.1109/IPFA.2014.6898127