DocumentCode
2357870
Title
On-line and off-line, analogue and digital, circuit and board, safety and reliability: how to solve the testing puzzle?
Author
Lubaszewski, Marcelo ; Courtois, Bernard
Author_Institution
INPG/TIMA, Grenoble, France
fYear
1994
fDate
5-8 Dec 1994
Firstpage
472
Lastpage
477
Abstract
A unified methodology for the design for testability of critical systems is presented, which is based on merging the following complementary aspects of testing: off-line and on-line checking, analogue and digital, circuit and board testing, safety and reliability. Past and present developments undertaken in every aspect of this methodology are described, and future trends are briefly discussed
Keywords
design for testability; integrated circuit testing; life testing; printed circuit testing; production testing; safety; analogue testing; board testing; critical systems; design for testability; digital testing; off-line checking; on-line checking; reliability; safety; Automatic testing; Built-in self-test; Circuit testing; Debugging; Electronic equipment testing; Integrated circuit interconnections; Integrated circuit testing; Prototypes; Safety; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1994. APCCAS '94., 1994 IEEE Asia-Pacific Conference on
Conference_Location
Taipei
Print_ISBN
0-7803-2440-4
Type
conf
DOI
10.1109/APCCAS.1994.514596
Filename
514596
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