DocumentCode
2357878
Title
Fouling of high density heat sinks - theoretical origins and numerical analysis
Author
Montgomery, Stephen W.
Author_Institution
Adv. Syst. Lab., Intel Corp., DuPont, WA, USA
fYear
2002
fDate
12-14 March 2002
Firstpage
132
Lastpage
136
Abstract
Heat sinks and other components must operate in a thermal envelope that calls for continuous operation over long periods of time. Increasing thermal loads are resulting in widespread acceptance of densely packed heat sinks with closely spaced fins. However, the environment surrounding heat sinks and other electronic components is not ideal. Particulate contaminants are present in the ambient supply air in nearly every office, home or other zone of operation. These contaminants are ingested by the cooling systems and subsequently introduced to these heat sinks. Repeated exposure to particulate contamination can lead to the phenomena known as thermal fouling, where contaminant particles adhere themselves to the surface of the heat sink, acting as an insulating layer and thus reducing thermal performance. This analysis seeks to quantify the reduction in performance experienced by a dense pin fin array exposed to a contaminated operating environment. Results of numerical simulations illustrate the potentially drastic effects on fin effectiveness and overall airflow rate in a uniformly coated, fouled array. The fundamental theories of particulate adhesion are discussed and an experimental course of action for verification of the reduction in performance owing to fouling is suggested.
Keywords
cooling; heat sinks; thermal conductivity; thermal management (packaging); closely spaced fins; dense pin fin array; densely packed heat sinks; fin effectiveness; high density heat sinks; insulating layer; overall airflow rate; particulate contaminants; thermal envelope; thermal fouling; thermal loads; thermal performance; Electronic components; Electronics cooling; Heat sinks; Insulation; Lead; Numerical simulation; Performance analysis; Space heating; Surface contamination; Thermal loading;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management, 2002. Eighteenth Annual IEEE Symposium
Conference_Location
San Jose, CA, USA
ISSN
1065-2221
Print_ISBN
0-7803-7327-8
Type
conf
DOI
10.1109/STHERM.2002.991358
Filename
991358
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