• DocumentCode
    2357922
  • Title

    Optimum pressure in low temperature direct metal bonding

  • Author

    Ang, X.F. ; Liu, H.P. ; Tan, Y.L. ; Lu, H.J. ; Wei, J. ; Zhang, H.J. ; Chen, Z. ; Wong, C.C.

  • Author_Institution
    Singapore Inst. of Manuf. Technol., Singapore, Singapore
  • fYear
    2010
  • fDate
    8-10 Dec. 2010
  • Firstpage
    251
  • Lastpage
    254
  • Abstract
    The influence of bonding pressure during low temperature direct metal bond formation between gold studs and electroplated copper joints respectively was evaluated. The findings obtained showed an optimum pressure where bond strength peaks before degrading at further increase in bond pressure. Furthermore, it was found that the increase in bond strength does not correspond to a relative dilation of the bonded area. Both observations deviate from the common understanding that higher bond strength can be achieved with higher bonding pressure and corresponding increase in bonded area. Such contradiction is possibly related to the interfacial deformation phenomenon between locally bonded sites at the interface rather than the bulk deformation behaviour of the bump when bonding pressure exceeds a critical value.
  • Keywords
    bonding processes; copper; electroplating; gold; bond strength; bonding pressure; bulk deformation behaviour; electroplated copper joint; gold stud; interfacial deformation; low temperature direct metal bonding; optimum pressure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2010 12th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-8560-4
  • Electronic_ISBN
    978-1-4244-8561-1
  • Type

    conf

  • DOI
    10.1109/EPTC.2010.5702642
  • Filename
    5702642