DocumentCode
2357969
Title
Development of an innovative multi-detector triangulation laser probe
Author
Shiou, F.J. ; Cheng, W.Y.
Author_Institution
Dept. of Mech. Eng., Nat. Taiwan Sci. & Technol. Univ., Taipei, Taiwan
fYear
2005
fDate
10-12 July 2005
Firstpage
318
Lastpage
322
Abstract
This study presents the design and manufacture of a prototype of a multi-detector triangulation laser probe. The developed system was configured and assembled based on the Scheimpflug principle. The probe system mainly consists of a diode laser, six collimating lenses, six position sensitive detectors (PSD), a signal processing circuit, and an A/D interface card. Through the specific arrangement of the PSD, four different measurement modules for the developed system are possible, namely the standard triangulation probe module, double triangulation probe module, pentagon-shaped triangulation probe module, and an approximately circular triangulation probe module. Bused on the calculation and filtering of the pentagon-shaped PSD signals, the measurement accuracy was improved. The developed laser probe system was integrated with a coordinate measuring machine, to construct a non-contact measurement system. According to the experimental results, the measurement uncertainty of the developed laser probe system, with respect to different surface roughness and slope, was about 15 microns. Among the four different measurement modules checked, the pentagon-shaped triangulation probe module has the best result.
Keywords
coordinate measuring machines; position sensitive particle detectors; probes; prototypes; semiconductor lasers; surface roughness; Scheimpflug principle; analog-to-digital interface card; circular triangulation probe module; collimating lenses; coordinate measuring machine; diode laser; double triangulation probe module; measurement accuracy; multidetector triangulation laser probe; pentagon-shaped triangulation probe module; position sensitive detectors; signal processing circuit; standard triangulation probe module; surface roughness; Assembly systems; Collimators; Coordinate measuring machines; Diode lasers; Lenses; Manufacturing; Optical design; Position sensitive particle detectors; Probes; Prototypes;
fLanguage
English
Publisher
ieee
Conference_Titel
Mechatronics, 2005. ICM '05. IEEE International Conference on
Conference_Location
Taipei
Print_ISBN
0-7803-8998-0
Type
conf
DOI
10.1109/ICMECH.2005.1529276
Filename
1529276
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