Title :
Test chips for advanced packaging
Author :
Reinert, Wolfgang ; Kähler, Dirk
Author_Institution :
Fraunhofer Inst. for Silicon Technol., Itzehoe, Germany
Abstract :
Electronic packaging is advancing very fast and often a gap between availability of first functional chips and the need to develop their packaging processes and bill of materials exists. With the use of test chips and 200 mm test wafers from a qualified industrial wafer fab, this gap can be shrinked both in respect to timing as well as in gaining first production experience on high volume.
Keywords :
wafer level packaging; electronic packaging; first functional chip; industrial wafer fab; size 200 mm; test chips; test wafers;
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2010 12th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-8560-4
Electronic_ISBN :
978-1-4244-8561-1
DOI :
10.1109/EPTC.2010.5702656