DocumentCode :
2358195
Title :
Clutter Reduction in Multi-Dimensional Data Visualization Using Dimension Reordering
Author :
Peng, Wei ; Ward, Matthew O. ; Rundensteiner, Elke A.
Author_Institution :
Dept. of Comput. Sci., Worcester Polytech. Inst., MA
fYear :
0
fDate :
0-0 0
Firstpage :
89
Lastpage :
96
Abstract :
Visual clutter denotes a disordered collection of graphical entities in information visualization. Clutter can obscure the structure present in the data. Even in a small dataset, clutter can make it hard for the viewer to find patterns, relationships and structure. In this paper, we define visual clutter as any aspect of the visualization that interferes with the viewer´s understanding of the data, and present the concept of clutter-based dimension reordering. Dimension order is an attribute that can significantly affect a visualization´s expressiveness. By varying the dimension order in a display, it is possible to reduce clutter without reducing information content or modifying the data in any way. Clutter reduction is a display-dependent task. In this paper, we follow a three-step procedure for four different visualization techniques. For each display technique, first, we determine what constitutes clutter in terms of display properties; then we design a metric to measure visual clutter in this display; finally we search for an order that minimizes the clutter in a display
Keywords :
clutter; computer displays; data visualisation; pattern recognition; user interfaces; very large databases; dimension reorder; display technique; information visualization; multidimensional data visualization; pattern identification; visual clutter reduction; visual structure; Chromium; Computer science; Data visualization; Displays; Gain measurement; Multidimensional systems; Pattern recognition; Polarization; Scattering; User interfaces; Multidimensional visualization; dimension order; visual clutter; visual structure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Visualization, 2004. INFOVIS 2004. IEEE Symposium on
Conference_Location :
Austin, TX
ISSN :
1522-404X
Print_ISBN :
0-7803-8779-3
Type :
conf
DOI :
10.1109/INFVIS.2004.15
Filename :
1382895
Link To Document :
بازگشت