• DocumentCode
    2358238
  • Title

    Programmable logic gate based on controlled quenching of series-connected negative differential resistance devices

  • Author

    Chen, K.J. ; Waho, T. ; Maezawa, K. ; Yamamoto, M.

  • Author_Institution
    NTT LSI Labs., Kanagawa, Japan
  • fYear
    1996
  • fDate
    26-26 June 1996
  • Firstpage
    170
  • Lastpage
    171
  • Abstract
    The unique characteristics of resonant-tunneling (RT) devices, such as the negative differential resistance (NDR), can be used to construct compact functional circuits. In this work, we propose and experimentally demonstrate a new circuit that takes full advantage of the NDR feature in RT devices. The circuit features three NDR devices connected in series and is driven by a clocked bias voltage V/sub BIAS/. The function of the circuit can be selected as one of the six logic functions (AND, OR, NAND, NOR, XOR, and XNOR) by control voltages and the amplitude of V/sub BIAS/. This flexible functionality indicates that our circuit can be applied to the implementation of programmable logic circuits, which will provide cost-effective prototypes for modern circuit designs.
  • Keywords
    active networks; logic gates; negative resistance devices; programmable logic devices; resonant tunnelling devices; clocked bias voltage; compact functional circuit; controlled quenching; programmable logic gate; resonant-tunneling devices; series-connected negative differential resistance devices; Clocks; Logic devices; Logic functions; Logic gates; Programmable control; Programmable logic arrays; Programmable logic devices; RLC circuits; Resonant tunneling devices; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 1996. Digest. 54th Annual
  • Conference_Location
    Santa Barbara, CA, USA
  • Print_ISBN
    0-7803-3358-6
  • Type

    conf

  • DOI
    10.1109/DRC.1996.546423
  • Filename
    546423