Title :
A80-a new perspective on predictable factory performance
Author :
Cunningham, Calum ; Babikian, Richard
Author_Institution :
Intel Ireland Ltd., Ireland
Abstract :
Predictable output performance that maximizes asset utilization is the cornerstone of successful volume manufacturing. The theory of constraints (Goldratt, 1985) uses the principles of covariance and dependent events to describe how equipment or operations that dominate factory performance should be managed. In practice, the `true constraint´ is elusive and is seldom the designed constraint. This paper introduces a new statistically based equipment performance management methodology called A80 which focuses on equipment or operation performance variability to rapidly identify and improve the `true constraint´ performance. The A80 methodology, initially developed at Intel´s Fab 10 facility and subsequently adopted by all Intel 200 mm facilities, rejects the traditional use of average availability as a primary indicator of equipment performance and capacity because it provides no indication of stability, and thus invariably fails to prompt the correct response to performance inconsistencies. This paper describes the A80 concept, tools and methods developed in Fab 10 and uses data and case study materials to show how the methodology is successfully applied
Keywords :
constraint theory; integrated circuit manufacture; manufacturing resources planning; statistical analysis; A80 concept; A80 methodology; A80 methods; A80 statistically based equipment performance management methodology; A80 tools; asset utilization maximization; average availability; covariance; dependent events; designed constraint; equipment capacity; equipment performance; equipment performance variability; factory performance; operation performance variability; performance inconsistencies; predictable factory performance; predictable output performance; stability; theory of constraints; true constraint; true constraint performance; volume manufacturing; Availability; Capacity planning; Constraint theory; Fluctuations; Manufacturing processes; Production facilities; Robustness; Semiconductor materials; Stability; Statistics;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1998. 1998 IEEE/SEMI
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-4380-8
DOI :
10.1109/ASMC.1998.731399