Title :
ATR-FTIR, DUAL BEAM FIB-SEM, TEM and TOF-SIMS studies on high temperature and moisture induced “white haze” following the pattern of electrodes in touch panels
Author :
Chen Yixin ; Hao Meng ; Shao Jingjing ; Esther, Lee ; Khoo Bing Sheng ; Chooi Meailing ; Li Kai ; Xin Qiuju ; Cambridge, Kon ; Lee Hwang Sheng ; Shen Yiqiang ; Song Lu ; Xing Zhenxiang ; Zhou Yongkai ; Feng Yang ; Fu Chao ; Hua Younan ; Li Xiaomin
Author_Institution :
WinTech Nano-Technol. Services Pte. Ltd., Singapore, Singapore
fDate :
June 30 2014-July 4 2014
Abstract :
White haze or the so called mura effect has been recognized as a common defect in touch panels. Nevertheless, the underlying mechanism has not been fully understood and clearly investigated. In this study, a comprehensive characterization study using the ATR-FTIR, DUAL BEAM FIB-SEM, TEM and TOF-SIMS on the high temperature and moisture induced white haze, which follows the pattern of electrodes in touch panels, is first reported. It is suspected that the white haze is a moisture induced reflection alteration phenomenon of the OCA (optically clear adhesive), while the electrodes related pattern is highly dependent on the local variation in hygroscopic swelling.
Keywords :
Fourier transform spectra; adhesives; attenuated total reflection; electrodes; infrared spectra; scanning electron microscopy; secondary ion mass spectra; swelling; time of flight spectra; transmission electron microscopy; ATR-FTIR; DUAL BEAM FIB-SEM; OCA; TEM; TOF-SIMS; common defect; electrodes pattern; high temperature induced white haze; hygroscopic swelling; local variation; moisture induced white haze; mura effect; optically clear adhesive; reflection alteration phenomenon; touch panels; Decision support systems; Failure analysis; Integrated circuits;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2014 IEEE 21st International Symposium on the
Conference_Location :
Marina Bay Sands
Print_ISBN :
978-1-4799-3931-2
DOI :
10.1109/IPFA.2014.6898153
