DocumentCode :
2358277
Title :
Optimal device for a low output impedance voltage source for Electrical Impedance Tomography (EIT) systems
Author :
Qureshi, T. ; Mehboob, B. ; Chatwin, C.R. ; Wang, W.
Author_Institution :
Biomed. Eng., Univ. of Sussex, Brighton, UK
fYear :
2012
fDate :
6-8 May 2012
Firstpage :
1
Lastpage :
6
Abstract :
The key component in bio-impedance measurement systems is an excitation source. Electrical Impedance Tomography (EIT) can be performed by injecting current and measuring the resulting voltages, or by applying voltages and measuring the current developed. Interesting characteristics of breast tissues mostly lie above 1MHz; therefore a wideband excitation source covering higher frequencies (i.e. above 1MHz) is required. A viable bandwidth envelope that can be used to design a constant EIT source having low output impedance is the main objective of this research. This paper proposes a voltage controlled voltage source (VCVS) tested by using different nonideal devices. The performance is compared with each other and decision is made which device can be used over a wide bandwidth (100Hz-20MHz) to design an excitation source. This paper also describes the performance of the designed EIT voltage source for different load conditions and load capacitances reporting signal-to-noise ratio, signal phase and output impedance of the source. Preliminary data obtained using Pspice® is used to demonstrate the high-bandwidth performance of the source.
Keywords :
electric current measurement; electric impedance imaging; voltage measurement; Pspice simulation; VCVS testing; bandwidth 100 Hz to 20 MHz; bioimpedance measurement system; breast tissue; constant EIT voltage source; current injection; current measurement; electrical impedance tomography system; load capacitance; low output impedance voltage source; optimal device; signal-to-noise ratio; viable bandwidth envelope; voltage controlled voltage source testing; voltage measurement; wideband excitation source; Bandwidth; Capacitance; Current measurement; Impedance; Signal to noise ratio; Tomography; Voltage measurement; EIT; Electrical impedance tomography; Impedance tomography hardware; Voltage source;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electro/Information Technology (EIT), 2012 IEEE International Conference on
Conference_Location :
Indianapolis, IN
ISSN :
2154-0357
Print_ISBN :
978-1-4673-0819-9
Type :
conf
DOI :
10.1109/EIT.2012.6220742
Filename :
6220742
Link To Document :
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