DocumentCode :
2358320
Title :
Reliability of palladium coated copper wire
Author :
Stephan, Dominik ; Wulff, Frank W. ; Milke, Eugen
Author_Institution :
Heraeus Mater. Singapore Pte Ltd., Singapore, Singapore
fYear :
2010
fDate :
8-10 Dec. 2010
Firstpage :
343
Lastpage :
348
Abstract :
Alternative solutions for Au wire are high in demand as a result of increasing gold price and high demand for lower cost packages. Copper wire has been the natural low cost alternative but concerns on corrosion susceptibility and package reliability have driven the industry to look for better alternative wire materials while maintaining substantial material cost savings. PdCu wire is supposed to close this gap and serves a promising solution for applications that require cost effectiveness (still significant cost saving over gold) and robust bonding performance (closer to that of gold wire). One critical question in the industry currently is, whether or not PdCu wire can address the reliability concerns, which are occurring at some copper wire applications in the field. This paper will cover the intermetallic phase growth of PdCu wire on Al pad metallization at as bonded condition and tries to understand whether or not there is any difference at the interface compared to bare copper, during initial bonding and during reliability testing like HTS, HAST and PCT.
Keywords :
coating techniques; copper; corrosion; electronics packaging; metallisation; palladium; reliability; Al pad metallization; HAST; HTS; PCT; PdCu; corrosion susceptibility; cost effectiveness; intermetallic phase growth; package reliability; palladium coated copper wire; reliability testing; robust bonding; FAB; Intermetallic; PdCu wire; Reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2010 12th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-8560-4
Electronic_ISBN :
978-1-4244-8561-1
Type :
conf
DOI :
10.1109/EPTC.2010.5702660
Filename :
5702660
Link To Document :
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