DocumentCode
2358325
Title
Tunneling in nanoscale silicon particles embedded in an a-SiO/sub 2/ matrix
Author
Tsu, R. ; Boeringer, D.W. ; Nicollian, E.H.
Author_Institution
North Carolina Univ., Charlotte, NC, USA
fYear
1996
fDate
26-26 June 1996
Firstpage
178
Lastpage
179
Abstract
The starting point of our endeavor, in the realization of a resonant tunneling structure in silicon, is based on the fact that sufficiently small particles with dimensions below the electron mean free path should exhibit quantum effects resulting in a series of resonant tunneling similar to resonant tunneling through a double barrier quantum well structure. A diode structure was fabricated with a thin layer (10-20 nm) of nanoscale silicon particles embedded in an a-SiO/sub 2/ matrix between an n-type silicon substrate and an aluminum contact. Discrete sharp conductance peaks, having linewidth of 25-30 meV, were observed even at room temperature.
Keywords
elemental semiconductors; nanostructured materials; resonant tunnelling diodes; silicon; silicon compounds; Si-SiO/sub 2/; amorphous SiO/sub 2/ matrix; conductance oscillations; nanoscale silicon particles; quantum effects; resonant tunneling diode; Aluminum; Current measurement; Electrical resistance measurement; Electrons; Light emitting diodes; Quantum dots; Resonant tunneling devices; Silicon; Time measurement; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 1996. Digest. 54th Annual
Conference_Location
Santa Barbara, CA, USA
Print_ISBN
0-7803-3358-6
Type
conf
DOI
10.1109/DRC.1996.546427
Filename
546427
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