• DocumentCode
    2358325
  • Title

    Tunneling in nanoscale silicon particles embedded in an a-SiO/sub 2/ matrix

  • Author

    Tsu, R. ; Boeringer, D.W. ; Nicollian, E.H.

  • Author_Institution
    North Carolina Univ., Charlotte, NC, USA
  • fYear
    1996
  • fDate
    26-26 June 1996
  • Firstpage
    178
  • Lastpage
    179
  • Abstract
    The starting point of our endeavor, in the realization of a resonant tunneling structure in silicon, is based on the fact that sufficiently small particles with dimensions below the electron mean free path should exhibit quantum effects resulting in a series of resonant tunneling similar to resonant tunneling through a double barrier quantum well structure. A diode structure was fabricated with a thin layer (10-20 nm) of nanoscale silicon particles embedded in an a-SiO/sub 2/ matrix between an n-type silicon substrate and an aluminum contact. Discrete sharp conductance peaks, having linewidth of 25-30 meV, were observed even at room temperature.
  • Keywords
    elemental semiconductors; nanostructured materials; resonant tunnelling diodes; silicon; silicon compounds; Si-SiO/sub 2/; amorphous SiO/sub 2/ matrix; conductance oscillations; nanoscale silicon particles; quantum effects; resonant tunneling diode; Aluminum; Current measurement; Electrical resistance measurement; Electrons; Light emitting diodes; Quantum dots; Resonant tunneling devices; Silicon; Time measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 1996. Digest. 54th Annual
  • Conference_Location
    Santa Barbara, CA, USA
  • Print_ISBN
    0-7803-3358-6
  • Type

    conf

  • DOI
    10.1109/DRC.1996.546427
  • Filename
    546427