DocumentCode
2358387
Title
Simulations for initiation of vacuum insulator flashover
Author
Perkins, M.P. ; Houck, T.L. ; Marquez, A.R. ; Vogtlin, G.E.
Author_Institution
Lawrence Livermore Nat. Lab., Livermore, CA, USA
fYear
2010
fDate
23-27 May 2010
Firstpage
727
Lastpage
730
Abstract
The vacuum/dielectric interface of insulators is often the weakest part in high voltage and pulsed power systems. Surface flashover can occur for electric field values much lower than that of bulk breakdown through the material. Although much empirical data and many theories can be found in the literature, there are no models that can be used to optimally design insulators and reliably predict when flashover will occur. In this presentation we will discuss the results of a FDTD-PIC code that is being used to model physics phenomena common to many flashover theories. In order to simulate the initiation of vacuum insulator flashover, VORPAL is being used on the Linux clusters at LLNL. In we presented the results for implementing physics modules that included the effects of field distortion due to the dielectric, Fowler-Nordheim field emission, low energy secondary emission, insulator charging, and magnetic fields. We have extended our previous work to include a thin gas layer near the surface of the insulator. Electrons may cause ionization depending on their energies and the collision cross section of the gas. The inclusion of these physics effects leads to a more complete model and better understanding of vacuum insulator flashover.
Keywords
field emission; flashover; high-voltage techniques; insulators; pulsed power technology; Fowler-Nordheim field emission; Linux cluster; field distortion effect; high voltage system; insulator charging; low energy secondary emission; pulsed power system; thin gas layer; vacuum insulator flashover; vacuum-dielectric interface; Argon; Flashover; Insulators; Ionization; Water;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Modulator and High Voltage Conference (IPMHVC), 2010 IEEE International
Conference_Location
Atlanta, GA
Print_ISBN
978-1-4244-7131-7
Type
conf
DOI
10.1109/IPMHVC.2010.5958462
Filename
5958462
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