DocumentCode
2358409
Title
High responsitivity intrinsic photoconductors based on Al/sub x/Ga/sub 1-x/N
Author
Lim, B.W. ; Chen, Q.C. ; Khan, M.A. ; Sun, C.J. ; Yang, J.Y.
Author_Institution
APA Opt. Inc., Blaine, MN, USA
fYear
1996
fDate
26-26 June 1996
Firstpage
192
Lastpage
193
Abstract
Recently several AlGaN-InGaN devices such as blue lasers, blue-green LEDs and high frequency transistors have been reported. In past we have demonstrated GaN based intrinsic photoconductors, Schottky barrier and pn-junction detectors with a long-wavelength cutoff at 365 nm. We now report on the fabrication of true solar-blind ultraviolet photoconductive detectors with Al/sub x/Ga/sub 1-x/N active layers over basal plane sapphire substrates. For sensors with aluminum mole fractions ranging from 5 to 61%, the long wavelength cutoff can be varied from 350 to 240 nm. Photoresponsitivities as high as several hundred amperes per watt were measured for sensors with 10 /spl mu/m inter-electrode spacing.
Keywords
III-V semiconductors; aluminium compounds; gallium compounds; photoconducting devices; photodetectors; ultraviolet detectors; 10 micron; 240 to 350 nm; Al/sub 2/O/sub 3/; AlGaN; III-V semiconductors; basal plane sapphire substrates; inter-electrode spacing; intrinsic photoconductors; long wavelength cutoff; photoresponsitivities; responsitivity; solar-blind ultraviolet photoconductive detectors; Aluminum; Detectors; Frequency; Gallium nitride; Laser beam cutting; Light emitting diodes; Optical device fabrication; Photoconductivity; Schottky barriers; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 1996. Digest. 54th Annual
Conference_Location
Santa Barbara, CA, USA
Print_ISBN
0-7803-3358-6
Type
conf
DOI
10.1109/DRC.1996.546432
Filename
546432
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