• DocumentCode
    2358431
  • Title

    Fabrication of nanodevices using sub-25 nm imprint lithography

  • Author

    Krauss, P.R. ; Renstrom, P.J. ; Chou, S.Y.

  • Author_Institution
    Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
  • fYear
    1996
  • fDate
    26-26 June 1996
  • Firstpage
    194
  • Lastpage
    195
  • Abstract
    The key obstacle that prevents many nanostructures and nanodevices from becoming economically viable is the lack of a high-throughput and low-cost nanolithography method. Recently, a high-throughput and low-cost nanolithography method, imprint lithography, has been proposed and demonstrated. Here, we report new progress in imprint lithography and the first fabrication of nanodevices (such as MSM photodetectors and Si quantum wire transistors) using imprint lithography. In imprint lithography a mold with nanoscale features is first pressed into a resist film cast on a substrate to create a thickness contrast pattern in the resist. After removing the mold, an anisotropic etching process is used to transfer the pattern through the entire resist thickness by removing the remaining resist in the compressed areas.
  • Keywords
    electron beam lithography; etching; nanotechnology; photodetectors; semiconductor quantum wires; semiconductor technology; MSM photodetectors; anisotropic etching process; electron beam lithography; imprint lithography; nanodevices; nanolithography method; nanostructures; quantum wire transistors; resist film; thickness contrast pattern; Anisotropic magnetoresistance; Etching; Fabrication; Lithography; Nanolithography; Nanostructures; Photodetectors; Resists; Substrates; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 1996. Digest. 54th Annual
  • Conference_Location
    Santa Barbara, CA, USA
  • Print_ISBN
    0-7803-3358-6
  • Type

    conf

  • DOI
    10.1109/DRC.1996.546433
  • Filename
    546433