DocumentCode
2358431
Title
Fabrication of nanodevices using sub-25 nm imprint lithography
Author
Krauss, P.R. ; Renstrom, P.J. ; Chou, S.Y.
Author_Institution
Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
fYear
1996
fDate
26-26 June 1996
Firstpage
194
Lastpage
195
Abstract
The key obstacle that prevents many nanostructures and nanodevices from becoming economically viable is the lack of a high-throughput and low-cost nanolithography method. Recently, a high-throughput and low-cost nanolithography method, imprint lithography, has been proposed and demonstrated. Here, we report new progress in imprint lithography and the first fabrication of nanodevices (such as MSM photodetectors and Si quantum wire transistors) using imprint lithography. In imprint lithography a mold with nanoscale features is first pressed into a resist film cast on a substrate to create a thickness contrast pattern in the resist. After removing the mold, an anisotropic etching process is used to transfer the pattern through the entire resist thickness by removing the remaining resist in the compressed areas.
Keywords
electron beam lithography; etching; nanotechnology; photodetectors; semiconductor quantum wires; semiconductor technology; MSM photodetectors; anisotropic etching process; electron beam lithography; imprint lithography; nanodevices; nanolithography method; nanostructures; quantum wire transistors; resist film; thickness contrast pattern; Anisotropic magnetoresistance; Etching; Fabrication; Lithography; Nanolithography; Nanostructures; Photodetectors; Resists; Substrates; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 1996. Digest. 54th Annual
Conference_Location
Santa Barbara, CA, USA
Print_ISBN
0-7803-3358-6
Type
conf
DOI
10.1109/DRC.1996.546433
Filename
546433
Link To Document