• DocumentCode
    2358481
  • Title

    Newly developed integration method for biomedical implants using flexible polymer cable

  • Author

    Daquan, Yu ; Ming-Yuan, Cheng ; Lim Li Shiah ; Paing, Myo ; Aibin, Yu

  • Author_Institution
    Inst. of Microelectron., A*STAR (Agency for Sci., Technol. & Res.), Singapore, Singapore
  • fYear
    2010
  • fDate
    8-10 Dec. 2010
  • Firstpage
    388
  • Lastpage
    392
  • Abstract
    This paper presented an integration method for biomedical implants by using solder bonding and highly flexible polyimide (PI) cable. The proposed integration method can overcame the problems in flexible cable assembly before. It can achieve a small form, and better reliability, and is easier for fragile MEMS device bonding by using solder bonding. Therefore, it is suitable for various MEMS devices integration. The effect of the metal materials and reliability of the flexible cable with thin metal trace were studied. SEM and TEM/EDX analysis were performed to evaluate the boning interface microstructures. Electrical tests were carried out to study the resistance of the interconnects. Thermal cycling test with temperature range of -40/+125°C with 15mins dwell for 500 cycles was used to evaluate the reliability properties of the interconnects. The results showed good bonding interface, low electrical resistance and there were no major changes in resistance during thermal cycling. Hence, it implied that the interconnections were highly stable and reliable by using the proposed bonding method.
  • Keywords
    X-ray chemical analysis; bioMEMS; biomedical materials; electric resistance; heat treatment; materials testing; polymers; prosthetics; scanning electron microscopy; soldering; transmission electron microscopy; EDX analysis; MEMS device bonding; MEMS device integration; SEM analysis; TEM analysis; biomedical implant integration method; bonding interface; boning interface microstructure; electrical resistance; electrical tests; flexible cable assembly; flexible cable reliability; flexible polymer cable; highly flexible polyimide cable; interconnect resistance; metal materials; solder bonding; temperature 233.15 K to 398.15 K; thermal cycling; thin metal trace;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2010 12th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-8560-4
  • Electronic_ISBN
    978-1-4244-8561-1
  • Type

    conf

  • DOI
    10.1109/EPTC.2010.5702669
  • Filename
    5702669