DocumentCode :
2358601
Title :
A novel low-cost package RF function verification by oscillator specification variation
Author :
Chen, Yi-Han ; Yeh, Wei-Ting ; Wu, Sung-Mao ; Tu, Chen-Chia ; Hwang, Jun-Jie
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Kaohsiung, Kaohsiung, Taiwan
fYear :
2010
fDate :
8-10 Dec. 2010
Firstpage :
408
Lastpage :
411
Abstract :
This paper is focus on low cost testing method for process variation filters which is made by integrated passive device (IPD) or discrete circuit by one easy circuit, oscillator (OSC). The research is base on studying a new method to test by using a simple circuit. The 2.4GHz band-pass filter (BPF) as the device under test (DUT), using the OSC as a test circuit. For using OSC as a test circuit to the basic structure, we take band pass filter into a part of LC tank in OSC. When filters have process variation, the frequency of the OSC will change. Then determine the quality of the band-pass filter. At last, this test circuit will make a test board to measure the data practically to prove this new method for low cost testing.
Keywords :
band-pass filters; oscillators; semiconductor device packaging; semiconductor device testing; BPF; DUT; IPD; OSC; band-pass filter; device under test; discrete circuit; frequency 2.4 GHz; integrated passive device; low cost testing method; low-cost package RF function verification; oscillator specification variation; process variation filter; Oscillators; negative resistance; resonator filters; test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2010 12th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-8560-4
Electronic_ISBN :
978-1-4244-8561-1
Type :
conf
DOI :
10.1109/EPTC.2010.5702673
Filename :
5702673
Link To Document :
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