• DocumentCode
    2358776
  • Title

    Enhancing fab performance under team council methodology

  • Author

    Dupuis, Ronald N., Jr. ; Gervais, John ; Park, Steven

  • Author_Institution
    Fairchild Semicond., South Portland, ME, USA
  • fYear
    1998
  • fDate
    23-25 Sep 1998
  • Firstpage
    119
  • Lastpage
    121
  • Abstract
    The objective of this paper is to outline and describe the process of developing team councils in a wafer fab organization. Initially, we present the historical background and why we thought this type of approach was necessary to achieve high performance from all levels of the organization. A road map to success as well as a task level migration matrix describes the different levels of responsibility needed to achieve the results described in the conclusion of this paper. Though this process is still evolving and developing in the authors´ South Portland fab, the paper describes the necessary steps to implement this process
  • Keywords
    computer integrated manufacturing; integrated circuit reliability; integrated circuit technology; integrated circuit yield; management; manufacturing resources planning; training; CIM; process implementation; responsibility levels; road map; task level migration matrix; team council methodology; team councils; training; wafer fab organization; wafer fab performance; Buildings; Computer integrated manufacturing; Councils; Data engineering; Management training; Manufacturing processes; Process control; Productivity; Semiconductor device manufacture; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 1998. 1998 IEEE/SEMI
  • Conference_Location
    Boston, MA
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-4380-8
  • Type

    conf

  • DOI
    10.1109/ASMC.1998.731424
  • Filename
    731424