Title :
Reliability prediction and real world for LED lamps
Author :
Mura, Gianluca ; Vanzi, M.
Author_Institution :
DIEE - Dept. of Electr. & Electron. Eng., Univ. of Cagliari, Cagliari, Italy
fDate :
June 30 2014-July 4 2014
Abstract :
The paper focuses on Reliability of Reliability Predictions by comparison with available Reliability Data Sheet and Accelerated Stress Test results on commercially available devices. The striking difference in the predicted MTTFs (Mean Time To Failure) is discussed.
Keywords :
LED lamps; life testing; reliability; LED lamps; mean time-to-failure; predicted MTTF; reliability data sheet-accelerated stress test; reliability prediction; Acceleration; Integrated circuit reliability; LED lamps; Reliability engineering; Standards; Stress;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2014 IEEE 21st International Symposium on the
Conference_Location :
Marina Bay Sands
Print_ISBN :
978-1-4799-3931-2
DOI :
10.1109/IPFA.2014.6898188
