Title :
Testing C-elements is not elementary
Author :
Brzozowski, J.A. ; Raahemifar, K.
Author_Institution :
Dept. of Comput. Sci., Waterloo Univ., Ont., Canada
Abstract :
We examine stuck-at faults in several gate circuits realizing the C-element. We exhibit circuits with the following phenomena: (a) 50% of single faults do not cause the circuit to halt. (b) Some faults are not detectable by logic tests. (c) A test of length seven is required to detect all detectable single faults. (d) A fault may result in an oscillation. (e) A fault may destroy the speed-independence of a circuit. We also analyze static and dynamic CMOS implementations of the C-element
Keywords :
asynchronous circuits; fault location; logic testing; C-element; C-elements testing; CMOS implementations; gate circuits; logic tests; speed-independence; stuck-at faults; Asynchronous circuits; Automatic testing; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Logic testing; Sequential analysis; Sequential circuits;
Conference_Titel :
Asynchronous Design Methodologies, 1995. Proceedings., Second Working Conference on
Conference_Location :
London
Print_ISBN :
0-8186-7098-3
DOI :
10.1109/WCADM.1995.514652
