• DocumentCode
    2359087
  • Title

    Operational status of the Brookhaven National Laboratory Accelerator Test Facility

  • Author

    Batchelor, K. ; Ben-Zvi, I. ; Biglio, I. ; Chou, T.S. ; Fernow, R.C. ; Fischer, J. ; Gallardo, J. ; Kirk, G. ; Kurnit, N. ; McDonald, K.T. ; Palmer, R.B. ; Parsa, Z. ; Pellegrini, C. ; Sheehan, J. ; Srinivasan-Rao, T. ; Ulc, S. ; van Steenbergen, A. ; Woo

  • Author_Institution
    Brookhaven Nat. Lab., Upton, NY, USA
  • fYear
    1989
  • fDate
    20-23 Mar 1989
  • Firstpage
    273
  • Abstract
    The design and operation of a 50-MeV electron linear accelerator utilizing a low emittance (γε=5 to 10 mm-mrad) radio-frequency gun operating at an output energy of 5 MeV and a charge of 1 nC are described. Design calculations, early radio-frequency measurements, and operational experience with the electron gun utilizing a dummy cathode in place of the proposed photocathode emitter are given. The dynamics of the electron beam coming off the photocathode has been modeled with the programs PARMELA and MASK. General agreement as to the expected characteristics of the electron beam at the RF-gun exit has been obtained using the two programs. It was also verified that, with proper matching of the transverse beam, no increase of the transverse normalized emittance occurs at the linac due to the fundamental RF mode
  • Keywords
    electron accelerators; electron guns; linear accelerators; particle beam diagnostics; physics computing; 5 MeV; 50 MeV; Brookhaven National Laboratory Accelerator Test Facility; MASK; PARMELA; design; electron beam; electron linear accelerator; operation; radio-frequency gun; radio-frequency measurements; transverse beam; transverse normalized emittance; Cathodes; Copper; Electron accelerators; Electron beams; Electron emission; Laboratories; Life estimation; Radio frequency; Test facilities; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 1989. Accelerator Science and Technology., Proceedings of the 1989 IEEE
  • Conference_Location
    Chicago, IL
  • Type

    conf

  • DOI
    10.1109/PAC.1989.73144
  • Filename
    73144