• DocumentCode
    2359109
  • Title

    Multiple Environment Overstress Testing and modelling of solar cells

  • Author

    Veninga, E.P. ; Gielen, A.W.J.

  • Author_Institution
    TNO Sci. & Ind., Eindhoven, Netherlands
  • fYear
    2010
  • fDate
    26-28 April 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Solar modules are typically qualified by conducting a sequence of industry standard tests, for example IEC 61215 and 61646. Although these tests are thorough and therefore also time consuming, the results cannot be used to determine the lifetime or make inferences about lifetime of the modules. New approaches are needed to fulfil requirements as designed lifetime typically 25 years and time-to-market reduction. To this end we have developed a novel approach that is based on both physical testing and finite element modelling to increase the understanding of how parts fail and how to improve designs. Physical and numerical experiments are used in a combined way appreciating the strengths and weaknesses of both.
  • Keywords
    IEC standards; finite element analysis; life testing; solar cells; time to market; IEC 61215; IEC 61646; designed lifetime; finite element modelling; industry standard tests; multiple environment overstress testing; physical testing; solar cells; solar modules; time-to-market reduction; Failure analysis; Finite element methods; IEC standards; Life testing; P-n junctions; Photovoltaic cells; Semiconductor device modeling; Statistical analysis; Temperature measurement; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE), 2010 11th International Conference on
  • Conference_Location
    Bordeaux
  • Print_ISBN
    978-1-4244-7026-6
  • Type

    conf

  • DOI
    10.1109/ESIME.2010.5464524
  • Filename
    5464524