DocumentCode :
2359109
Title :
Multiple Environment Overstress Testing and modelling of solar cells
Author :
Veninga, E.P. ; Gielen, A.W.J.
Author_Institution :
TNO Sci. & Ind., Eindhoven, Netherlands
fYear :
2010
fDate :
26-28 April 2010
Firstpage :
1
Lastpage :
1
Abstract :
Solar modules are typically qualified by conducting a sequence of industry standard tests, for example IEC 61215 and 61646. Although these tests are thorough and therefore also time consuming, the results cannot be used to determine the lifetime or make inferences about lifetime of the modules. New approaches are needed to fulfil requirements as designed lifetime typically 25 years and time-to-market reduction. To this end we have developed a novel approach that is based on both physical testing and finite element modelling to increase the understanding of how parts fail and how to improve designs. Physical and numerical experiments are used in a combined way appreciating the strengths and weaknesses of both.
Keywords :
IEC standards; finite element analysis; life testing; solar cells; time to market; IEC 61215; IEC 61646; designed lifetime; finite element modelling; industry standard tests; multiple environment overstress testing; physical testing; solar cells; solar modules; time-to-market reduction; Failure analysis; Finite element methods; IEC standards; Life testing; P-n junctions; Photovoltaic cells; Semiconductor device modeling; Statistical analysis; Temperature measurement; Time to market;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE), 2010 11th International Conference on
Conference_Location :
Bordeaux
Print_ISBN :
978-1-4244-7026-6
Type :
conf
DOI :
10.1109/ESIME.2010.5464524
Filename :
5464524
Link To Document :
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