DocumentCode
2359202
Title
Mechanism analyses on PBGA strip packaging warpage
Author
Kim, Yeong K. ; Park, In Soo ; Choi, Jooho ; Gang, Jin Hyuk
Author_Institution
Sch. of Mech. & Aerosp. Eng., Korea Aerosp. Univ., Goyang, South Korea
fYear
2010
fDate
26-28 April 2010
Firstpage
1
Lastpage
7
Abstract
The objective of this study is to analyze warpage development mechanism by simulating a strip type packaging for plastic ball grid array. Molding compound and substrate materials were thermo-mechanically tested to obtain the mechanical properties by several test methods. Samples were fabricated using the same materials, and warpage developments were measured at room temperature after molding compound cure. The results were compared with the measurement data of the samples, and the warpage mechanism was investigated based on the elastic and viscoelastic simulation results. The development mechanism was analyzed through the simulation calculations by combining different material properties modeling and geometries. It was found that the relaxation behaviors of the molding compound and the substrate materials, and the packaging geometry had significant effects on the warpage development. The development mechanism was comprehensively discussed based on the results.
Keywords
ball grid arrays; moulding; viscoelasticity; PBGA strip packaging warpage; material properties modeling; mechanical properties; molding compound; packaging geometry; plastic ball grid array; relaxation behaviors; strip type packaging; substrate materials; viscoelastic simulation; warpage development mechanism; Analytical models; Electronics packaging; Geometry; Materials testing; Mechanical factors; Plastic packaging; Solid modeling; Strips; Temperature measurement; Thermomechanical processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE), 2010 11th International Conference on
Conference_Location
Bordeaux
Print_ISBN
978-1-4244-7026-6
Type
conf
DOI
10.1109/ESIME.2010.5464527
Filename
5464527
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