DocumentCode :
2359356
Title :
Evaluation of security system based on failure-risk exposure
Author :
Purohit, Rajesh ; Chowdhary, K.R.
Author_Institution :
Dept. of Comp. Sci. & Eng., JNV Univ., Jodhpur, India
fYear :
2011
fDate :
22-24 April 2011
Firstpage :
185
Lastpage :
187
Abstract :
Verifying a security system needs large number of event sequences to be generated and applied to the candidate system. Like other systems, security systems have various components or subsystems i.e. hardware or software in it. A security subsystem is said to be failed in the case of false acception and false rejection. For a reliable system, verification has to be performed more extensively on specific part(s) of the system, which is expected to be used more. In this paper, usage pattern, failure risk and failure impact associated with every subsystem are considered as indicator parameters. The criticality is calculated on the basis of effective failure risk exposure (FRE) of the event sequences. This paper suggests a method to calculate criticality of part of the system which contribute more towards reliability of the security system.
Keywords :
failure analysis; risk analysis; security of data; event sequences; failure impact; failure-risk exposure; false acception; false rejection; security system reliability; security system verification; usage pattern; Computational modeling; Markov processes; Security; Silicon; Software; Software reliability; Failure State; False Acception; False Rejection; Finite State Machine; Reliability; Risk Exposure; Risk Impact; Usage Pattern;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Trends in Networks and Computer Communications (ETNCC), 2011 International Conference on
Conference_Location :
Udaipur
Print_ISBN :
978-1-4577-0239-6
Type :
conf
DOI :
10.1109/ETNCC.2011.5958512
Filename :
5958512
Link To Document :
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