1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385)

The following topics were dealt with: single-event-effects (SEE) test results on a variety of hardened and unhardened digital, mixed-signal, power and fiber-optic technologies including 32-bit microprocessors, DSPs, ADCs, SRAMs and DRAMs; total ionizing dose test results on a variety of hardened and unhardened digital, mixed-signal and analog technologies including micropower operational amplifiers, ADCs, DACs, Flash Memories, gate array devices and Voltage-to-Frequency Converters; total ionizing dose radiation test results for low dose-rates and post-burnin cases; dose-rate and neutron irradiation test results, including l/f noise, for both hardened and unhardened technologies; descriptions of several test facilities and an x-ray tester