Title :
The propagation constant of coaxial offset shorts with rough surfaces
Author :
Hoffmann, J. ; Ruefenacht, Juerg ; Zeier, M.
Author_Institution :
Fed. Inst. of Metrol. METAS, Bern-Wabern, Switzerland
Abstract :
Offset short calibration schemes for vector network analyzers require the exact knowledge of the propagation constant of the offsetting lines. The propagation constant is difficult to compute from first principles and thus a method to indirectly determine the propagation constant is presented. At 50 GHz, the method achieves improvements of accuracy of at least 0.013 in linear S-parameters for a 2.4mm offset short with length 13 mm.
Keywords :
calibration; network analysers; rough surfaces; calibration scheme; coaxial offset short propagation constant; distance 13 mm; frequency 50 GHz; linear S-parameter; offsetting line constant propagation; rough surface; vector network analyzer; Calibration; Connectors; Impedance; Microwave measurement; Propagation constant; Scattering parameters; Standards; attenuation constant; calibration; offset short; phase constant; propagation constant; vector network analyzer;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4799-5205-2
DOI :
10.1109/CPEM.2014.6898235