DocumentCode :
2359606
Title :
Bond wire design for eXtreme Switch devices
Author :
Hauck, Torsten ; Kolbeck, Anton
Author_Institution :
Freescale Halbleiter Deutschland GmbH, Munich, Germany
fYear :
2010
fDate :
26-28 April 2010
Firstpage :
1
Lastpage :
4
Abstract :
Freescale´s third-generation eXtreme Switch devices set performance standards for automotive lighting. They are tailored to drive high-intensity discharge (HID) xenon, halogen and light-emitting diode (LED) lamps. For example, a halogen lamp draws high levels of current when first turned on, but much less once it has stabilized. The ICs therefor allow the lamps to draw high levels of current when needed at turn-on but less during operation. Hence, these devices have to withstand the event of an inrush current each time a lamp is switched on. Package and wire bond design have to consider the transient characteristics of Joule heating and heat transfer. The authors developed an approach for the current carrying analysis of bond wires in power packages. It is based on closed form solutions of the heat equation at single current pulse, repeated current pulses or arbitrary inrush current profiles. This paper focuses on the analysis of Joule heating in bond wires. We will solve the initial and boundary value problem for the Joule heating at an inrush current pulse. The solution will be validated with thermo-electric finite element simulation. We will then draw conclusions for the wire bond design.
Keywords :
LED lamps; automotive electronics; discharge lamps; finite element analysis; lead bonding; Joule heating; automotive lighting; bond wire design; boundary value problem; extreme switch devices; heat equation; heat transfer; high-intensity discharge lamps; inrush current; light-emitting diode lamps; thermoelectric finite element simulation; Automotive engineering; Bonding; Heat transfer; Heating; High intensity discharge lamps; Light emitting diodes; Packaging; Surges; Switches; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE), 2010 11th International Conference on
Conference_Location :
Bordeaux
Print_ISBN :
978-1-4244-7026-6
Type :
conf
DOI :
10.1109/ESIME.2010.5464545
Filename :
5464545
Link To Document :
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