Title :
Multivariate statistics applied to assess measurement uncertainty of complex reflection coefficient
Author :
Benjamin, M. ; Silva, Hugo ; Monasterios, G. ; Tempone, N. ; Henze, A.
Author_Institution :
Lab. Metrol. RF & Microondas, Inst. Nac. de Tecnol. Ind. (INTI), Argentina
Abstract :
In this paper we show an alternative mathematical interpretation of the error propagation law for complex quantities established in supplement 2 of the GUM [1]. We use this interpretation to study VNA´s one port reflection measurement which includes several terms that represent complex quantities. We show two different approaches to solve the problem that arises when trying to establish the variance matrix of the sum of two complex quantities. We also give explicit formulae to estimate uncertainty with both approaches.
Keywords :
covariance matrices; measurement uncertainty; network analysers; optical variables measurement; reflection; statistical analysis; VNA measurement; complex reflection coefficient; error propagation law; measurement uncertainty; multivariate statistics; reflection measurement; variance matrix; Covariance matrices; Equations; Mathematical model; Measurement uncertainty; Radio frequency; Reactive power; Uncertainty; GUM; RF metrology; VNA measurement; complex quantities; measurement uncertainty; multivariate statistics;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4799-5205-2
DOI :
10.1109/CPEM.2014.6898237