Title :
Honeywell radiation hardened 32-bit processor single event effects test results
Author :
Leavy, Scott C. ; Mogensen, Jeffrey A. ; Smith, Thomas S. ; Freitfeld, G.J. ; Brichacek, Julie
Author_Institution :
Space Syst., Honeywell Inc., Clearwater, FL, USA
Abstract :
We will present single event effects test results for the Honeywell radiation hardened 32-bit processor. The processor was tested at board-level while executing a signal and data processing benchmark suite
Keywords :
CMOS digital integrated circuits; aircraft computers; fault tolerance; microprocessor chips; pipeline processing; proton effects; radiation hardening (electronics); reduced instruction set computing; space vehicle electronics; very high speed integrated circuits; 32 bit; CMOS very high speed IC; Honeywell radiation hardened processor; RISC; SEU performance; board-level test; data processing benchmark suite; fault-tolerant processor chipset; pipeline architecture; signal processing benchmark suite; single event effects test results; Aerospace electronics; Circuit faults; Circuit testing; Fault tolerance; Laboratories; Performance evaluation; Radiation hardening; Single event upset; Software testing; System testing;
Conference_Titel :
Radiation Effects Data Workshop, 1998. IEEE
Conference_Location :
Newport Beach, CA
Print_ISBN :
0-7803-5109-6
DOI :
10.1109/REDW.1998.731467
