DocumentCode :
2359687
Title :
Viscoelastic properties effect on solder ball failure analyses
Author :
Kim, Yeong K. ; Gang, Jin Hyuk ; Lee, Bo-Young
Author_Institution :
Sch. of Aerosp. & Mech. Eng., Korea Aerosp. Univ., Goyang, South Korea
fYear :
2010
fDate :
8-10 Dec. 2010
Firstpage :
641
Lastpage :
645
Abstract :
The effects of material properties modeling on the solder failure analyses by numerical simulations are studied. The packaging structure of plastic ball grid array on printed circuit board was modeled. Two different types of molding compounds and two different types of substrates were employed and combined for the plastic ball grid array package modeling. The material properties were assumed as temperature dependent elastic and viscoelastic, and the strain energy densities of solder balls were calculate and analyzed. The results showed that the mechanism of the energy density developments were very different depending on the material properties modeling and their combinations. This study demonstrated that appropriate modeling of the material properties is critical for interpretation and understanding the microelectronics reliability mechanisms.
Keywords :
ball grid arrays; integrated circuit reliability; numerical analysis; printed circuits; solders; viscoelasticity; energy density development; material properties modeling; microelectronics reliability mechanism; molding compound; numerical simulation; packaging structure; plastic ball grid array package modeling; printed circuit board; solder ball failure analysis; strain energy density; viscoelastic property effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2010 12th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-8560-4
Electronic_ISBN :
978-1-4244-8561-1
Type :
conf
DOI :
10.1109/EPTC.2010.5702717
Filename :
5702717
Link To Document :
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