Title :
Board level solder joint reliability model for flip-chip ball grid array packages under compressive loads
Author :
Chiu, Tz-Cheng ; Lin, Jyun-Ji ; Gupta, Vikas ; Edwards, Darvin ; Ahmad, Mudasir
Author_Institution :
Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
The ever increasing power density in high performance microelectronic devices for large business computing and telecommunication infrastructure has led to several new reliability challenges for solder interconnects. One of them is the creep collapse and bridging of ball grid array (BGA) solder joints under heatsink compressive loads. In this study, the effect of heatsinking compressive load on the solder joint reliability is investigated by using both experimental and numerical approaches. A phenomenological life prediction model for both Sn36Pn2Ag and Sn3.8Ag0.7Cu solder joints subjected to constant compressive load is also proposed.
Keywords :
ball grid arrays; flip-chip devices; printed circuits; reliability; solders; ball grid array solder joint; board level solder joint reliability model; business computing; constant compressive load; creep collapse; flip-chip ball grid array package; heatsink compressive load; microelectronic device; phenomenological life prediction model; solder interconnects; telecommunication infrastructure;
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2010 12th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-8560-4
Electronic_ISBN :
978-1-4244-8561-1
DOI :
10.1109/EPTC.2010.5702718
