Title :
Dose rate, total dose and neutron radiation testing of COTS and military microcircuit devices
Author :
Mulford, Stewart G.
Author_Institution :
Raytheon Co., Sudbury, MA, USA
Abstract :
Radiation testing on a variety of Commercial Off the Shelf (COTS) and military devices has been performed for the prompt narrow and wide pulse dose rate, total dose gamma and neutron environments. Many of the devices reported on are those used for microprocessor and processor peripheral support applications
Keywords :
analogue integrated circuits; digital integrated circuits; failure analysis; gamma-ray effects; integrated circuit reliability; integrated circuit testing; military equipment; monolithic integrated circuits; neutron effects; COTS microcircuit devices; commercial off the shelf devices; dose rate testing; logic arrays; memory devices; microprocessor peripheral support applications; military microcircuit devices; neutron radiation testing; processor peripheral support applications; total dose gamma environment; total dose testing; Dosimetry; EPROM; Laboratories; Linear particle accelerator; Microprocessors; Neutrons; Performance evaluation; Random access memory; Test facilities; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 1998. IEEE
Conference_Location :
Newport Beach, CA
Print_ISBN :
0-7803-5109-6
DOI :
10.1109/REDW.1998.731484
