Title :
Total ionizing dose effects on voltage-to-frequency converters
Author :
Lee, C.I. ; Johnston, A.H. ; Rax, B.G.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
Three different voltage-to-frequency converters were tested to determine how ionizing radiation affected their critical specifications. All three were fabricated with bipolar technologies. A popular charge-balancing architecture converter, AD652, was most sensitive with low dose rate (LDR) due to its tight specifications. The other astable-multivibrator architecture converters, AD537 and AD654, performed much better at high dose rate and low dose rate
Keywords :
bipolar analogue integrated circuits; circuit stability; multivibrators; radiation effects; voltage-frequency convertors; AD537; AD652; AD654; V/F convertors; astable-multivibrator architecture converters; bipolar technologies; charge-balancing architecture converter; critical specifications; high dose rate; low dose rate; total ionizing dose effects; voltage-to-frequency converters; Acceleration; Analog-digital conversion; Capacitors; Circuits; Clocks; Frequency conversion; Operational amplifiers; Propulsion; Timing; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 1998. IEEE
Conference_Location :
Newport Beach, CA
Print_ISBN :
0-7803-5109-6
DOI :
10.1109/REDW.1998.731489
