• DocumentCode
    2360133
  • Title

    Virtual prototyping advanced by statistic and stochastic methodologies

  • Author

    Rzepka, Sven ; Müller, Axel ; Michel, Bernd

  • Author_Institution
    Micro Mater. Center, Fraunhofer ENAS, Chemnitz, Germany
  • fYear
    2010
  • fDate
    26-28 April 2010
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    The paper reports three examples of best industrial practice showing the substantial benefits gained in terms of time-to-market reduction when virtual prototyping is enhanced by statistical and stochastic methodologies. These examples from a microelectronics setting of high volume component and module manufacturing deal with different fields: i) ball grid array (BGA) design optimization based on sophisticated design-of-experiments (DoE) and response surface (RS) schemes, ii) material modeling based on stochastic parameter identification and optimization, and iii) process pre-qualification by involving a stochastic robustness analysis.
  • Keywords
    ball grid arrays; design of experiments; optimisation; response surface methodology; statistical analysis; stochastic processes; time to market; virtual prototyping; BGA; DoE; ball grid array design optimization; design-of-experiments; high volume component; material modeling; microelectronics setting; module manufacturing; process prequalification; response surface schemes; statistic methodology; stochastic methodology; stochastic parameter identification; stochastic robustness analysis; time-to-market reduction; virtual prototyping; Design optimization; Electronics packaging; Manufacturing industries; Manufacturing processes; Microelectronics; Statistics; Stochastic processes; Time to market; Virtual manufacturing; Virtual prototyping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE), 2010 11th International Conference on
  • Conference_Location
    Bordeaux
  • Print_ISBN
    978-1-4244-7026-6
  • Type

    conf

  • DOI
    10.1109/ESIME.2010.5464571
  • Filename
    5464571