Title :
Total dose evaluation of state-of-the-art commercial analog to digital converters for space-based imaging applications
Author :
Black, Jeffrey D. ; Eaton, Paul H. ; Chavez, Joseph R. ; Wilson, Anthony L. ; Merkel, Kenneth G. ; Pease, Ronald L.
Author_Institution :
Mission Res. Corp., Albuquerque, NM, USA
Abstract :
Total ionizing dose evaluation was performed on state-of-the-art commercial analog to digital (A/D) converters for use in space-based imaging applications. Although none of the devices were suitable for imaging, the evaluation showed that at least four of the eleven devices met the 50 krad (Si) failure dose radiation goal. Additionally, some of the A/D converters showed a fast annealing characteristic. With room temperature annealing, one device exhibited at least a threefold increase in failure dose. This project demonstrated that some of the new commercial A/D converters may have space applicability outside of imaging and that a comprehensive testing program is required for COTS parts
Keywords :
analogue-digital conversion; annealing; failure analysis; integrated circuit reliability; integrated circuit testing; monolithic integrated circuits; radiation effects; remote sensing; space vehicle electronics; 50 krad; A/D converters; COTS parts; analog to digital converters; commercial ADCs; failure dose radiation goal; fast annealing characteristic; room temperature annealing; space-based imaging applications; total dose evaluation; Analog-digital conversion; Annealing; Art; Crosstalk; Laboratories; Manufacturing; Performance evaluation; Pulse modulation; Temperature; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 1998. IEEE
Conference_Location :
Newport Beach, CA
Print_ISBN :
0-7803-5109-6
DOI :
10.1109/REDW.1998.731490