DocumentCode
2360144
Title
An intelligent defect inspection technique for color filter
Author
Chang, Chung-Lung ; Chang, Hsin-Hung ; Hsu, Chia-Pin
Author_Institution
Mech. Industry Res. Lab., Ind. Technol. Res. Inst., Hsinchu, Taiwan
fYear
2005
fDate
10-12 July 2005
Firstpage
933
Lastpage
936
Abstract
Automatic defect inspection systems are becoming more and more important in industrial production lines. Especially in electronics industry, an attempt is often made to achieve almost 100% quality control of all components and final goods. Here we are interested in the defect inspection of color filter, which is one of components in TFT-LCD module and gives each pixel of LCD its own color. The difficulties in the defect inspection of color filter are its complex texture and demand for high-speed processing. In this paper, we propose a neural-fuzzy-inference-network (NFIN)-based defect inspection algorithm to detect the materials with regular pattern such as color filter. The NFIN, which is basically a fuzzy inference system and its fuzzy rules and corresponding parameters can be learned by neural network automatically, is a good alternative to achieve the defect inspection. Experimental results show that the proposed algorithm is a promising method to detect the defects of color filter. The proposed algorithm can apply to not only the detection of color filter but also the detection of web materials.
Keywords
automatic optical inspection; fuzzy neural nets; fuzzy reasoning; learning (artificial intelligence); liquid crystal displays; optical filters; production engineering computing; quality control; TFT-LCD module; automatic systems; color filter; electronics industry; fuzzy rules; intelligent defect inspection technique; neural network learning; neural-fuzzy-inference-network-based defect inspection algorithm; quality control; web materials; Color; Electrical equipment industry; Electronics industry; Filters; Fuzzy neural networks; Fuzzy systems; Inference algorithms; Inspection; Production systems; Quality control;
fLanguage
English
Publisher
ieee
Conference_Titel
Mechatronics, 2005. ICM '05. IEEE International Conference on
Conference_Location
Taipei
Print_ISBN
0-7803-8998-0
Type
conf
DOI
10.1109/ICMECH.2005.1529388
Filename
1529388
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