• DocumentCode
    2360144
  • Title

    An intelligent defect inspection technique for color filter

  • Author

    Chang, Chung-Lung ; Chang, Hsin-Hung ; Hsu, Chia-Pin

  • Author_Institution
    Mech. Industry Res. Lab., Ind. Technol. Res. Inst., Hsinchu, Taiwan
  • fYear
    2005
  • fDate
    10-12 July 2005
  • Firstpage
    933
  • Lastpage
    936
  • Abstract
    Automatic defect inspection systems are becoming more and more important in industrial production lines. Especially in electronics industry, an attempt is often made to achieve almost 100% quality control of all components and final goods. Here we are interested in the defect inspection of color filter, which is one of components in TFT-LCD module and gives each pixel of LCD its own color. The difficulties in the defect inspection of color filter are its complex texture and demand for high-speed processing. In this paper, we propose a neural-fuzzy-inference-network (NFIN)-based defect inspection algorithm to detect the materials with regular pattern such as color filter. The NFIN, which is basically a fuzzy inference system and its fuzzy rules and corresponding parameters can be learned by neural network automatically, is a good alternative to achieve the defect inspection. Experimental results show that the proposed algorithm is a promising method to detect the defects of color filter. The proposed algorithm can apply to not only the detection of color filter but also the detection of web materials.
  • Keywords
    automatic optical inspection; fuzzy neural nets; fuzzy reasoning; learning (artificial intelligence); liquid crystal displays; optical filters; production engineering computing; quality control; TFT-LCD module; automatic systems; color filter; electronics industry; fuzzy rules; intelligent defect inspection technique; neural network learning; neural-fuzzy-inference-network-based defect inspection algorithm; quality control; web materials; Color; Electrical equipment industry; Electronics industry; Filters; Fuzzy neural networks; Fuzzy systems; Inference algorithms; Inspection; Production systems; Quality control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mechatronics, 2005. ICM '05. IEEE International Conference on
  • Conference_Location
    Taipei
  • Print_ISBN
    0-7803-8998-0
  • Type

    conf

  • DOI
    10.1109/ICMECH.2005.1529388
  • Filename
    1529388