Title :
Radiation testing results of COTS based space microcircuits
Author :
Layton, P. ; Anthony, H. ; Boss, R. ; Hsu, P.
Author_Institution :
Space Electron. Inc., San Diego, CA, USA
Abstract :
Single event effects and total ionizing dose data collected by SEi for Commercial-Off-The-Shelf (COTS) microcircuits are presented. The data was collected for evaluation of these devices for commercial space programs
Keywords :
aerospace testing; integrated circuit testing; radiation hardening (electronics); space vehicle electronics; COTS; SEi; Single event effects; commercial space programs; commercial-off-the-shelf microcircuits; radiation testing; space microcircuits; total ionizing dose; Electronic equipment testing; Integrated circuit modeling; Integrated circuit testing; Ionizing radiation; Performance evaluation; Production; Protection; Satellites; Single event upset; Software testing;
Conference_Titel :
Radiation Effects Data Workshop, 1998. IEEE
Conference_Location :
Newport Beach, CA
Print_ISBN :
0-7803-5109-6
DOI :
10.1109/REDW.1998.731499
