DocumentCode :
2360438
Title :
Fault tolerant circuits and probabilistically checkable proofs
Author :
Gál, Anna ; Szegedy, Mario
Author_Institution :
Dept. of Comput. Sci., Chicago Univ., IL, USA
fYear :
1995
fDate :
19-22 Jun 1995
Firstpage :
65
Lastpage :
73
Abstract :
We introduce a new model of fault tolerance for Boolean circuits. We consider synchronized circuits and we allow an adversary to choose a small constant fraction of the gates at each level of the circuit to be faulty. We require that even in the presence of such faults the circuit compute a “loose version” of the given function. We show that every symmetric function has a small (size O(n), depth O(log n)) fault tolerant circuit in this model. We also show a perhaps unexpected relation between our model and probabilistically checkable proofs
Keywords :
Boolean functions; computational complexity; fault tolerant computing; Boolean circuits; fault tolerant circuits; loose version; probabilistically checkable proofs; symmetric function; synchronized circuits; Boolean functions; Circuit faults; Computer science; Fault tolerance; Hardware; Redundancy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Structure in Complexity Theory Conference, 1995., Proceedings of Tenth Annual IEEE
Conference_Location :
Minneapolis, MN
ISSN :
1063-6870
Print_ISBN :
0-8186-7052-5
Type :
conf
DOI :
10.1109/SCT.1995.514728
Filename :
514728
Link To Document :
بازگشت