• DocumentCode
    236050
  • Title

    Fabrication and characterization of Nb/NbxSi1−x/Nb Josephson junction arrays for voltage standard

  • Author

    Wenhui Cao ; Jinjin Li ; Yuan Zhong ; Yonggang Liu ; Qing He

  • Author_Institution
    Nat. Inst. of Metrol., Beijing, China
  • fYear
    2014
  • fDate
    24-29 Aug. 2014
  • Firstpage
    116
  • Lastpage
    117
  • Abstract
    We report in CPEM 2014 our effort towards SNS Josephson junction devices for the quantum voltage standard. SNS junction array device, with Nb as the superconductor material (S) and NbxSi1-x alloy as the barrier material (N), is fabricated and tested by NIM (National Institute of Metrology). The I-V characteristic curves of the junction arrays are measured and the experimental results are discussed.
  • Keywords
    measurement standards; niobium; niobium alloys; silicon alloys; superconducting junction devices; superconducting materials; voltage measurement; Nb-NbxSi1-x-Nb; SNS Josephson junction arrays; quantum voltage standard; superconductor material; Fabrication; Josephson junctions; Junctions; Niobium; Silicon; Standards; Josephson junction arrays; NbxSi1−x; Niobium; voltage standard;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4799-5205-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2014.6898286
  • Filename
    6898286
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=236050