DocumentCode :
236050
Title :
Fabrication and characterization of Nb/NbxSi1−x/Nb Josephson junction arrays for voltage standard
Author :
Wenhui Cao ; Jinjin Li ; Yuan Zhong ; Yonggang Liu ; Qing He
Author_Institution :
Nat. Inst. of Metrol., Beijing, China
fYear :
2014
fDate :
24-29 Aug. 2014
Firstpage :
116
Lastpage :
117
Abstract :
We report in CPEM 2014 our effort towards SNS Josephson junction devices for the quantum voltage standard. SNS junction array device, with Nb as the superconductor material (S) and NbxSi1-x alloy as the barrier material (N), is fabricated and tested by NIM (National Institute of Metrology). The I-V characteristic curves of the junction arrays are measured and the experimental results are discussed.
Keywords :
measurement standards; niobium; niobium alloys; silicon alloys; superconducting junction devices; superconducting materials; voltage measurement; Nb-NbxSi1-x-Nb; SNS Josephson junction arrays; quantum voltage standard; superconductor material; Fabrication; Josephson junctions; Junctions; Niobium; Silicon; Standards; Josephson junction arrays; NbxSi1−x; Niobium; voltage standard;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
ISSN :
0589-1485
Print_ISBN :
978-1-4799-5205-2
Type :
conf
DOI :
10.1109/CPEM.2014.6898286
Filename :
6898286
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=236050
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