Title :
Full-wave analysis of RF SAW filter packaging
Author :
Finch, C. ; Yang, X. ; Wu, T. ; Abbott, B.
Author_Institution :
Central Florida Univ., Orlando, FL, USA
Abstract :
As SAW filters move to higher frequencies and smaller sizes, the packaging structure has an increasing effect on the electrical performance of the device. In order to correctly design a SAW filter, the package performance must be considered concurrently in the design process. This paper describes several new methods for package simulation in which a full-wave electromagnetic (EM) simulator is used to create a package model. A ceramic chip and wire package is used to demonstrate the techniques. The package model is combined with a model of a SAW ladder filter at 1960 MHz and compared to measured data. The full-wave simulation is first performed on an empty package, with inductors used to represent bond wires. More accuracy can be achieved if simplified bond wires are included in the full-wave analysis, although computation time increases. A more accurate model of the bond wire shape increases simulation time, with no increase in accuracy. Our results demonstrate that full-wave analysis techniques are useful for predicting critical parameters such as the shape and rejection level of a SAW filter
Keywords :
UHF filters; ceramic packaging; digital simulation; electronic engineering computing; finite element analysis; ladder filters; packaging; radiofrequency filters; surface acoustic wave filters; 1960 MHz; Ansoft; FEM; HFSS; High Frequency Structure Simulator; RF SAW filter packaging; SAW ladder filter; SMP-12 package; ceramic chip/wire package; electromagnetic simulator; finite element simulator; full-wave EM simulator; full-wave analysis; package model; package performance; package simulation; Bonding; Ceramics; Computational modeling; Electromagnetic modeling; Packaging; Process design; Radio frequency; SAW filters; Shape; Wire;
Conference_Titel :
Ultrasonics Symposium, 2001 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-7177-1
DOI :
10.1109/ULTSYM.2001.991583