Title :
Cryogenic test socket
Author :
Yonggang Liu ; Jinjin Li
Author_Institution :
Nat. Inst. of Metrol., Beijing, China
Abstract :
In this paper we present a cryogenic test socket used for the quick device measurement at liquid Helium temperature. The chip under test could be easily installed inside the socket with the help of a clamp cover. Large amount of pins with 0.3mm diameter and 2.4mm length are utilized for electric contact inside the socket. Contact resistances as low as 0.2ohm are realized in a temperature range from 4.2K to about 300K. The socket can work in the frequency range from DC to several GHz.
Keywords :
clamps; contact resistance; cryogenic electronics; electric connectors; electrical contacts; liquid helium; temperature measurement; test equipment; chip under test; clamp cover; cryogenic test socket; distance 0.3 mm; distance 2.4 mm; electric contact resistance; liquid helium temperature; quick device measurement; temperature 4.2 K to 300 K; temperature measurement; Contact resistance; Electrical resistance measurement; Helium; Pins; Resistance; Sockets; Temperature measurement; Test socket; contact resistance; cryogenic; liquid Helium;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4799-5205-2
DOI :
10.1109/CPEM.2014.6898289
